Elaboration and Characterization of ZnO/FTO thin films under different concentrations - Study dedicated to the photovoltaic systems - Study d

Document Type

Conference Proceeding

Source of Publication

2nd International Conference on Electrical, Communication and Computer Engineering, ICECCE 2020

Publication Date



© 2020 IEEE. This paper presents an elaboration of thin films dedicated to photovoltaic systems. Zinc oxide (ZnO) on fluorine tin oxide (FTO) coated glass substrates are one of the best semiconductors oriented to solar cell preparations. In this study, the ZnO solution is performed with some sol concentration (0.1 M to 0.5 M) to verify its effect on thin-film samples. On the other hand, samples prepared are analyzed and characterized in structural and the optical properties using different techniques as ultraviolet-visible (UV-vis) spectrometry, Fourier transform infrared spectroscopy (FT-IR) and X-ray diffraction (XRD). This work showed the variation of the energy gap (Eg) values. The Eg values allow us to ensure good solar cells. In this study, the thin films prepared showed that the energy gap values are ranged between 3.29 eV and 3.4 eV. These results led us to confirm the possibility of having an easy passage of the electrical current. In addition, the transmittance spectra of the ZnO/FTO thin films showed an average of ~75% in the visible region and presented sharp absorption edges at 375 nm. The experimental preparation ensures a good decision about electrical energy production which based on the photovoltaic systems.




Institute of Electrical and Electronics Engineers Inc.


Life Sciences


electrical current, fluorine tin oxide, FT-IR technique, photovoltaic system, semiconductor, spray pyrolysis, thin films, XRD diffraction, zinc oxide

Scopus ID


Indexed in Scopus


Open Access